Issue |
RAIRO-Theor. Inf. Appl.
Volume 40, Number 2, April-June 2006
Alberto Bertoni: Climbing summits
|
|
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Page(s) | 207 - 225 | |
DOI | https://doi.org/10.1051/ita:2006003 | |
Published online | 20 July 2006 |
Probabilistic models for pattern statistics
Dipartimento di Scienze dell'Informazione,
Università degli Studi di Milano, via Comelico 39/41, 20135 Milano, Italy;
goldwurm@dsi.unimi.it & radicion@dsi.unimi.it.
In this work we study some probabilistic models for the random generation of words over a given alphabet used in the literature in connection with pattern statistics. Our goal is to compare models based on Markovian processes (where the occurrence of a symbol in a given position only depends on a finite number of previous occurrences) and the stochastic models that can generate a word of given length from a regular language under uniform distribution. We present some results that show the differences between these two stochastic models and their relationship with the rational probabilistic measures.
Mathematics Subject Classification: 68Q45 / 68Q10 / 60J99
Key words: Pattern statistics / Markov chains / probabilistic automata / rational formal series.
© EDP Sciences, 2006
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