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Cited article:

Analog Probe Module (APM) for Enhanced IC Observability: From Concept to Application

Anshaj Shrivastava and Gaurab Banerjee
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 32 (12) 2355 (2024)
https://doi.org/10.1109/TVLSI.2024.3470342

COVERING OF TRANSIENT SIMULATION OF FEEDBACK-FREE CIRCUITS BY BINARY ANALYSIS

YULI YE and JANUSZ BRZOZOWSKI
International Journal of Foundations of Computer Science 17 (04) 949 (2006)
https://doi.org/10.1142/S0129054106004200